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| Artikel-Nr.:
5667A-9783038972846 Herst.-Nr.:
9783038972846 EAN/GTIN:
9783038972846 |
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| The intent of this Special Issue is to provide a framework with which scientists in several different disciplines, related to phase-contrast and dark-field imaging, can illustrate their ideas and results. The articles are reviews or very recent scientific reports; they address newcomers in the field, as well as experts and professors in fields of X-ray physics, electron, and phase-contrast X-ray imaging. Weitere Informationen: | | Author: | Simon Zabler | Verlag: | MDPI | Sprache: | eng |
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| Weitere Suchbegriffe: Moiré pattern analysis, Talbot-Interferometer, Electron Backscatter imaging, image processing, Coded-aperture imaging, Computed Tomography, medical imaging, Dark-field imaging, cultural heritage, X-ray scattering, X-ray Phase-contrast imaging |
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