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| Artikel-Nr.: 5667A-9783540507192 Herst.-Nr.: 9783540507192 EAN/GTIN: 9783540507192 |
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| Content.- 1. Continuous X-Rays.- 2. Characteristic X-Rays.- 3. Interaction of X-Rays with Matter.- 4. Secondary Spectra and Satellites.- 5. Scattering of X-Rays.- 6. Chemical Shifts in Emission Spectra.- 7. Absorption Spectra.- 8. Soft X-Ray Spectroscopy.- 9. Experimental Methods.- Appendix A Rutherford Scattering for an Attractive Field.- A.1 Equation of Hyperbola.- A.2 Rutherford Scattering.- Appendix B Bohr's Formula for Energy Loss.- Appendix C X-Ray Atomic Energy Levels.- Appendix D Electron Distribution Among the Levels of Free Atoms.- Appendix E Curves Representing Values of Electron Energies.- Appendix F Dipole Sum Rule.- Appendix G Screening Effect, According to Slater.- Appendix H Electronegativity Scale.- Appendix I Common Analyzing Crystals.- Appendix J Wavelength Tables.- References.- Author Index. Weitere Informationen: | | Author: | Bipin K. Agarwal | Verlag: | Springer Berlin | Sprache: | eng |
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| Weitere Suchbegriffe: Absorption; X-rayLaser; scattering; Semiconductor; Spectra; Synchrotronradiation, Absorption, X-ray spectroscopy, laser, scattering, semiconductor, spectra, spectroscopy, synchrotron radiation |
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