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| Artikel-Nr.: 5667A-9783030692117 Herst.-Nr.: 9783030692117 EAN/GTIN: 9783030692117 |
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 | Next Generation Measures Using Formal Techniques Weitere Informationen:  |  | Author: | Sebastian Huhn; Rolf Drechsler | Verlag: | Springer International Publishing | Sprache: | eng |
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 | Weitere Suchbegriffe: allgemeine technikbücher - englischsprachig, Circuit Design for Reliability; Digital System Test; SoC Testing; Testability, debug, and reliability; Testable Design, Digital System Test, Testable Design, Circuit Design for Reliability, SoC Testing, Testability, debug, and reliability |
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