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| Artikel-Nr.:
5667A-9783642098697 Herst.-Nr.:
9783642098697 EAN/GTIN:
9783642098697 |
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| Oscillation Control in Dynamic SPM with Quartz Sensors.- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation.- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies.- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science.- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements.- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip.- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations.- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction. Weitere Informationen: | | Author: | Bharat Bhushan; Harald Fuchs | Verlag: | Springer Berlin | Sprache: | eng |
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| Weitere Suchbegriffe: maschinenbau und fertigungstechnik, AFM; Polymer; REM; Spectroscopy; Ultrasound; ceramics; microscopy, AFM, REM, ceramics, microscopy, polymer, spectroscopy, ultrasound |
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