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Scanning Probe Microscopy in Nanoscience and Nanotechnology


Menge:  Stück  
Produktinformationen
cover
cover
Artikel-Nr.:
     5667A-9783662502204
Hersteller:
     Springer Verlag
Herst.-Nr.:
     9783662502204
EAN/GTIN:
     9783662502204
Suchbegriffe:
Chemische Technik
Chemische Technik - englischsprachi...
allgemeine Technikbücher
allgemeine Technikbücher - englisch...
Scanning Probe Microscopy Techniques.- Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids.- Photonic Force Microscopy: From Femtonewton Force Sensing to Ultra-Sensitive Spectroscopy.- Polarization-Sensitive Tip-Enhanced Raman Scattering.- Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes.- Carbon Nanotube Atomic Force Microscopy with Applications to Biology and Electronics.- Novel Strategies to Probe the Fluid Properties and Revealing its Hidden Elasticity.- Combining Atomic Force Microscopy and Depth-Sensing Instruments for the Nanometer-Scale Mechanical Characterization of Soft Matter.- Static and Dynamic Structural Modeling Analysis of Atomic Force Microscope.- Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy.- Characterization.- Simultaneous Topography and Recognition Imaging.- Structural and Mechanical Mechanisms of Ocular Tissues Probed by AFM.- Force-Extension and Force-Clamp AFM Spectroscopies in Investigating Mechanochemical Reactions and Mechanical Properties of Single Biomolecules.- Multilevel Experimental and Modelling Techniques for Bioartificial Scaffolds and Matrices.- Quantized Mechanics of Nanotubes and Bundles.- Spin and Charge Pairing Instabilities in Nanoclusters and Nanomaterials.- Mechanical Properties of One-Dimensional Nanostructures.- Colossal Permittivity in Advanced Functional Heterogeneous Materials: The Relevance of the Local Measurements at Submicron Scale.- Controlling Wear on Nanoscale.- Contact Potential Difference Techniques as Probing Tools in Tribology and Surface Mapping.- Industrial Applications.- Modern Atomic Force Microscopy and Its Application to the Studyof Genome Architecture.- Near-Field Optical Litography.- A New AFM-Based Lithography Method: Thermochemical Nanolithography.- Scanning Probe Alloying Nanolithography.- Structuring the Surface of Crystallizable Polymers with an AFM Tip.- Application of Contact Mode AFM to Manufacturing Processes.- Scanning Probe Microscopy as a Tool Applied to Agriculture.
Weitere Informationen:
Author:
Bharat Bhushan
Verlag:
Springer Berlin
Sprache:
eng
Weitere Suchbegriffe: chemische technik - englischsprachig, Industrie, Nanomaterial, Sensor, atomic force microscope, biomimetics, biosensor, carbon nanotubes, electronics, mechanics, modeling, nanoscience
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